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Showing results: 2251 - 2265 of 2415 items found.

  • PXI-6281, 16 AI (18-Bit, 625 kS/s), 2 AO, 24 DIO, PXI Hybrid, Multifunction I/O Module

    779121-01 - NI

    16 AI (18-Bit, 625 kS/s), 2 AO, 24 DIO, PXI Multifunction I/O Module—The PXI‑6281 offers analog input, correlated digital I/O, two 32‑bit counter/timers, and analog and digital triggering. The device delivers low-cost, reliable DAQ capabilities in a wide range of applications from simple applications in laboratory automation, research, design verification/test, and manufacturing test. You can add sensor and high-voltage measurement capability to your device with SCC or SCXI signal conditioning modules. The included NI‑DAQmx driver and configuration utility simplify configuration and measurements.

  • USB-6281, 16 AI (18-Bit, 625 kS/s), 2 AO (2.86 MS/s), 24 DIO USB Multifunction I/O Device

    780054-04 - NI

    16 AI (18-Bit, 625 kS/s), 2 AO (2.86 MS/s), 24 DIO USB Multifunction I/O Device - The USB‑6281 offers analog input, correlated digital I/O, two 32‑bit counters/timers, and analog and digital triggering. The device delivers low-cost, reliable DAQ capabilities in a wide range of applications from simple applications in laboratory automation, research, design verification/test, and manufacturing test. You can add sensor and high-voltage measurement capability to your device with SCC or SCXI signal conditioning modules. The included NI‑DAQmx driver and configuration utility simplify configuration and measurements.

  • USB-6281, 16 AI (18-Bit, 625 kS/s), 2 AO (2.86 MS/s), 24 DIO USB Multifunction I/O Device

    780054-07 - NI

    16 AI (18-Bit, 625 kS/s), 2 AO (2.86 MS/s), 24 DIO USB Multifunction I/O Device - The USB‑6281 offers analog input, correlated digital I/O, two 32‑bit counters/timers, and analog and digital triggering. The device delivers low-cost, reliable DAQ capabilities in a wide range of applications from simple applications in laboratory automation, research, design verification/test, and manufacturing test. You can add sensor and high-voltage measurement capability to your device with SCC or SCXI signal conditioning modules. The included NI‑DAQmx driver and configuration utility simplify configuration and measurements.

  • USB-6361, 16 AI (16-Bit, 2 MS/s), 2 AO (2.86 MS/s), 24 DIO USB Multifunction I/O Device

    781442-01 - NI

    16 AI (16-Bit, 2 MS/s), 2 AO (2.86 MS/s), 24 DIO USB Multifunction I/O Device - The USB-6361 offers analog I/O, digital I/O, and four 32-bit counters/timers for PWM, encoder, frequency, event counting, and more. Onboard NI-STC3 timing and synchronization technology delivers advanced timing functionality, including independent analog and digital timing engines and retriggerable measurement tasks. The USB-6361 is well suited for a broad range of applications, from basic data logging to control and test automation. The included NI-DAQmx driver and configuration utility simplify configuration and measurements.

  • USB-6361, 16 AI (16-Bit, 2 MS/s), 2 AO (2.86 MS/s), 24 DIO USB Multifunction I/O Device

    782254-01 - NI

    16 AI (16-Bit, 2 MS/s), 2 AO (2.86 MS/s), 24 DIO USB Multifunction I/O Device - The USB-6361 offers analog I/O, digital I/O, and four 32-bit counters/timers for PWM, encoder, frequency, event counting, and more. Onboard NI-STC3 timing and synchronization technology delivers advanced timing functionality, including independent analog and digital timing engines and retriggerable measurement tasks. The USB-6361 is well suited for a broad range of applications, from basic data logging to control and test automation. The included NI-DAQmx driver and configuration utility simplify configuration and measurements.

  • USB-6361, 16 AI (16-Bit, 2 MS/s), 2 AO (2.86 MS/s), 24 DIO USB Multifunction I/O Device

    782255-01 - NI

    16 AI (16-Bit, 2 MS/s), 2 AO (2.86 MS/s), 24 DIO USB Multifunction I/O Device - The USB-6361 offers analog I/O, digital I/O, and four 32-bit counters/timers for PWM, encoder, frequency, event counting, and more. Onboard NI-STC3 timing and synchronization technology delivers advanced timing functionality, including independent analog and digital timing engines and retriggerable measurement tasks. The USB-6361 is well suited for a broad range of applications, from basic data logging to control and test automation. The included NI-DAQmx driver and configuration utility simplify configuration and measurements.

  • Zero Bias Schottky Detectors

    Fairview Microwave Inc.

    Fairview Microwave’s line of coaxial packaged zero bias Schottky detectors feature matched inputs for excellent VSWR, voltage sensitivity levels that range from 100 to 500 mV/mW for small signal detection, negative video output polarity, and can withstand maximum input power levels up to +20 dBm CW. Operating temperature range covers 0°C to +90°C and storage temperature of -65°C to +125°C. These zero bias Schottky detectors utilize compact cylindrical package outlines that are made of passivated stainless steel and offer a variety of popular input/output SMA and BNC connector configurations that make them ideal for use with precision test and measurement, instrumentation, and subsystems assemblies. Numerous applications include power measurement, leveling pulsed signal sources, AM noise measurements, radar or missile guidance systems, monitoring system level performance, and pulsed RF measurements.

  • Motor Test for Electric Scooters

    MOTOMEA

    *The performance data of electric motors, in the majority of all cases, is performed by a brake test. Power input is calculated from current and voltage. Torque and power output are measured with a brake. It is important to reach, for each point, a persistent temperature. In case of large outer rotor BLDC motors, which are usually used for electric scooters, this traditional procedure may take many hours to complete, and is very complicated. *For several years, an innovative motor tester of MEA Testing Systems Ltd. is on the market. This testing system avoids any temperature confusion by testing a motor at constant temperature over the entire speed range. The test procedure is very fast, and gives the full load performances, including PWM current, voltage, torque, and driver efficiency, from stall up to no load. *During the test procedure, the motor is freely accelerated from stall to no load speed. The load of the motor is only the predetermined inertia of the rotor. From the moment of inertia and the acceleration, the torque of the motor is calculated and, also, the power output over the whole speed is given. Since the entire measuring time, depending on the motor size, is usually less than one second, the motor has no time to warm up. It remains at room temperature.

  • Motor Testing Equipment for EOL- BLDC (Brushless) Motors

    MotorLine® - MLI-B - MOTOMEA

    *Performs QA testing on 100% of production without compromising line throughput (up to 10 motors per minute), reducing costs of defective products.*Determines acceptability to user predefined PASS/FAIL limits on production lines.*Provides motor performance data, from stall up to no-load, within seconds, including: torque, speed, current, voltage, input power, output power, time, motor efficiency, driver efficiency, direction of rotation.*Provides dynamic performance tests data, including: speed and torque spectrum, speed and torque oscillations, friction torque, friction spectrum, friction output power, cogging torque level.*Supports non-contact frictionless sensors.*Supports motor’s internal speed sensors.*Support sensorless BLDC motors.*Speed range up to 250,000 rpm.*Motor power switching is done by the motor electronics; the data sampling is started while the motor starts moving.*Motors can be tested inside their applications.*Motor performance data can be recorded in the system database for comparison and statistical analysis.*Test results are provided graphically and tabulated.*Test reports in PDF and Excel format.*Capability for integration with third party devices, such as hipot & insulation resistance testers.

  • Relay Test Set

    RNT-5A - Neutronics Manufacturing Co.

    This is a portable testing kit in one unit, suitable for testing protective relay, over current relay, earth fault relay, protective device, circuit breaker, tripping coils etc.The set is designed for both laboratory and field use. TECHNICAL FEATURES: INPUT : 230 Volts, single phase, 50Hz. AC. OUTPUTS : : 1) Current Output: a) 0- 1Amp. At 6/60Volts. (Continuous duty). b) 0- 5 Amps. At 6/60 Volts. (Continuous duty). c) 0- 10 Amps. At 6/60 Volts. (Continuous duty). d) 0- 20 Amps. At 6 Volts. (for30 min. duty). e) 0- 50 Amps. At 6Volts. (For 10 min. duty). f) 0-100 Amps. At 6 volts. (For10 min. duty). g) 0-200 Amps at 6Volts. (For 30 sec. duty). Current output is continuously variable and the output is taken out through a multi range C.T. The secondary is connected to an ammeter scaled in 0 to 100%. Output current range 1Amp. To 20Amps. Are selected by current range selector switch with common output terminals and for other three ranges three brass terminals are provided of proper ratting. 2) AC Voltage Output: Continuously variable 0 -230V AC. Capacity- 240VA (Max). OR DC Voltage Output: Continuously Variable 0-240V DC. Capacity-240VA.(max). One change over switch should be provided for selection of Volt. Meter for AC or DC voltage output & either AC or Dc voltage should be available at a time. 3) Time Measurement: 0-9.999Secs. & 0-99.99Secs. in two ranges. Accuracy: 1% CURRENT CIRCUIT: Loading transformer: Double winding loading transformer of suitable burden to provided corresponding current output specified before. One change over switch in current ckt. To be provided for voltage selection i.e. selection of 10volt. Or 50volt. Measuring CT: Multi ratio wound primary current transformer Ratio : 1-5-10-20-50-100-200A/5A. Variable auto transformer: For smooth variation of current output at various ranges selected. Tripping circuit: The current output will be cutoff incase of any overload for the range 200A or even if the relay under test actuated.

  • Electrical Probe Systems

    Instec, Inc.

    INSTEC's Probe Systems offer an integrated solution for performing component-level electrical measurements over a wide temperature range.Compact Mini Probe Stages enable an existing inspection microscope or optical test setup to be converted easily into a precision temperature-controlled semiconductor testing and qualification station.Analytical probe stations are fully featured industry-standard platforms for all modern probing applications and testing.Benchtop Probe Stations provide the user with four independent electrical probes with X,Y,Z micropositioning for precise placement without opening the sample chamber.​Highly configurable probe systems meet a range of requirements for atmospheric and temperature control, sample areas, and electrical measurements.

  • PXI 32 Channel I/O, High Side Driver

    40-413-001 - Pickering Interfaces Ltd.

    A 32 channel Digital I/O module with high output voltage and currentcapability and a dual variable threshold input. The 40-413 range is available in three configurations, a high side only (shown here), alow side only and a combined high and low side each capable of driving 2A loads. Eachoutput is fully protected against over-voltage, over-current and thermal overload,ensuring robust and reliable operation in the toughest test environments. For highside voltage driving the high side voltage source is supplied from an external voltagesource, permitting the module to drive high capacity loads without impacting thePXI chassis power supply.

  • High Performance High Power DC Electronic Load

    IT8900 Series - I-TECH Electronic Co., Ltd

    IT8900 series of high performance high power dc electronic loads provide three voltage ranges 150V/600V/1200V. The power expands to 600kW by master-slave paralleling, and maintains stand-alone functions. 50kHz high speed measurement, six working modes, transient over-power loading capability, CV loop speed adjustment, Measurement function, 25kHz dynamic test and other multiple accurate testing functions make IT8900 series well-suited for types of high power applications. Built-in LAN/USB/RS232/GPIB interfaces are designed formany fields such as power supply, power battery, DC charging station, generators, military and aerospace etc.

  • RF Noise Source

    NS-3 - Applied Instruments, Inc.

    The NS-3 Broadband RF Noise Generator provides an extremely flat AWGN (Additive White Gaussian Noise) signal from 5 to 2150 MHz. The output level adjusts in 0.1 dB steps over a 30 dB range.The bench-top configuration is standard and an optional two unit rack enclosure is available. The RS232 or USB remote control interface simplifies its use in automated test and factory ATE environments. The NS-3's combination of range, versatility and value make it the ideal general purpose broad-spectrum signal source for bench and ATE applications, including C/N, BER, MER, PER testing and rain fade simulation.

  • Benchtop Thermal Forcing System

    Wewon Environmental Chambers Co, Ltd.

    Benchtop thermal forcing system from Wewon Environmental Chambers Co., Ltd. has a mini body structure and affordable machine price. The machine can test a wide temperature range, Since no compressor is required for refrigeration, so the benchtop temperature forcing unit’s energy consumption is very low. The repeated resistance degree of the tested sample in the instantaneous extremely high temperature and extremely low temperature continuous environment can detect the chemical changes and physical damage caused by thermal expansion and cold contraction of the sample in the shortest time, so as to achieve the goal of confirming the quality of the tested sample.https://www.wewontech.com/benchtop-thermal-forcing-system/

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